Abstract

The distinction of the pure electronic instantaneous and the non-instantaneous (NI) nonlinear optical refractive index of materials, is not easy to do without using time-resolved methods. Usually, time-resolved method such as Kerr effect relies on two-beam use, which experimentally, can be complicate [1]. Here we propose a new single-beam, single-scan and self-referenced method based on the nonlinear ellipse rotation (NER) [2] to observe the NI nonlinearities contributions. We did measurements in silica (reference), CS₂, and acetone with different pulse durations. As we going to see, the NI nonlinearities can be detected by following the changing of the NER signal with pulse duration.

© 2015 IEEE