Abstract
Arbitrary waveform synthesis [1] offers the possibility to study and control electronic and nuclear processes with attosecond temporal resolution [2], and to enable ‘sub-cycle’ pulses and optimize high harmonic generation (HHG) [3, 4]. Appropriate metrology is critical to ensure the correct waveform is generated at the location of the experiment. Solutions to this measurement problem must deliver (a) adequate bandwidth; (b) sufficient efficiency; (c) sensitivity to phase across well-separated spectral components; (d) sensitivity to carrier-envelope phase (CEP); (e) reliable calibration procedures that can account for propagation between the measurement instrument and the experiment itself. Here we describe an experimental demonstration of the first all-optical method to characterize in-situ the real electric field of an arbitrary optical waveform based on HHG.
© 2013 IEEE
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