Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group
  • CLEO/Europe and IQEC 2007 Conference Digest
  • (Optica Publishing Group, 2007),
  • paper CE_5

Photoluminescence of Nd3+: YLF crystalline nanofilms deposited on YLF substrates via pulsed laser ablation

Not Accessible

Your library or personal account may give you access

Abstract

We report the realization of monocrystalline nanofilms of Nd3+-doped fluoride on LiYF4 (YLF) substrates by pulsed laser deposition (PLD). Both the bulk Nd3+:LiYF4 (Nd:YLF) crystal and the YLF substrates were grown by using a conventional Czochralski furnace with conventional resistive heating. The films were obtained with the pulsed laser ablation and film deposition facility, by ablating bulk YLF crystals doped with Nd3+ ions at 1.5% atomic concentration (at.) with 355 nm laser photons, in a UHV chamber. The average film thickness was obtained by an in situ interferometric technique, while the film optical characteristics were analyzed ex situ via laser induced fluorescence (LIF) spectroscopy following the IR excitation of the fundamental Nd3+ absorption band in the 800 nm range. Lifetime measurements of the Nd3+ ion 4F3/2 manifold in the film were also performed by the temporal analysis of the fundamental Nd3+ ion transition. All the results were compared with those obtained, in the same experimental conditions, in a Nd:YLF bulk crystal. We deposited several films whose thickness varies between 100 and 400 nm in high vacuum (7.7×10−5 Pa) or in a 1 Pa Ne atmosphere by changing important parameters such as the ablating laser fluency, the number of ablation shots and the temperature of the substrate. We obtained monocrystalline Nd:YLF films on the YLF substrates as testified by the comparison between the film and the bulk fluorescence spectra following excitation around 800 nm, an example of which is shown in fig. 1 where the spectra corresponding to the emission from the 4F3/2 level to the 4In/2 one are plotted both for the bulk crystal (gray line) and for the film (black line). The latter was obtained by ablating a monocrystalline 1.5 % at. Nd:YLF crystal with 355 nm laser pulses from a Nd:YAG laser whose duration was 13 ns at 10 Hz repetition rate. The ablation beam was focused to an 800 pm diameter; the laser fluency was set at 4 J/cm2. The temperature of the subs (rale was 650 °C and the film growth was produced in a 1 Pa Ne atmosphere with 42000 laser shots. The match between the spectra is evident and the presence of well resolved, narrow lines in the film spectrum is a mark of its single crystalline nature. The lifetime of the 4F3/2 manifold measured in this film gives a value (272 + 5 ps) shorter than that in the bulk (466 + 1 ps) even if the difference reduces significantly in the case of films grown with a higher laser fluency (10 J/cm2) and a shorter number of shots (12000) in UHV. By modifying some deposition parameters, the growth of films of different Nd3+ doped crystals such as Nd3+: YF3, is also possible. A morphological study of the depositions has just begun via SEM analysis which shows a rather homogeneous distribution of the film.

© 2007 IEEE

PDF Article
More Like This
Luminescence and Lifetime Properties of Nd3+:LaF3 Thin Films Grown by Pulsed Laser Deposition

Naoki Yoshida, Mirai Ieda, Shingo Ono, Kohei Yamanoi, Toshihiko Shimizu, Nobuhiko Sarukura, Yuui Yokota, Takayuki Yanagida, and Akira Yoshikawa
WPE_13 Conference on Lasers and Electro-Optics/Pacific Rim (CLEO/PR) 2013

Pulsed-laser deposition and characterization of Nd:Y3AI5O12 crystalline thin films on (100) silicon substrates

Mizunori Ezak, Hiroshi Kumagai, Katsutarou Kobayashi, Koichi Toyoda, and Minoru Obara
CWF62 Conference on Lasers and Electro-Optics (CLEO:S&I) 1995

Crystalline carbon nitride films coherently grown on Si (100) substrates by reactive pulsed laser ablation

G Barucca, L Elia, M Fernandez, A Luches, G Majni, M Martino, and P Mengucci
CWF58 The European Conference on Lasers and Electro-Optics (CLEO/Europe) 2000

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.