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Fundamental limits to the excitation of polaritons in thin films

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Abstract

Polaritonic modes in two-dimensional van der Waals materials display short in-plane wavelengths compared with light in free space. However, such large confinement is accompanied by poor in/out optical coupling, which severely limits the application of polaritons in practical devices. Here, we quantify the coupling strength between light and 2D polaritons in thin films using accurate rigorous analytical methods. In particular, we obtain universal expressions for the cross sections associated with photon−polariton coupling by point and line defects, as well as with polariton extinction and scattering processes. Additionally, we find closed-form constraints that limit the maximum possible values of these cross sections. Our results bear fundamental interest for the development of 2D polaritonics and the design of applications based on these excitations.

© 2021 The Author(s)

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