We combine a near-field scanning optical microscope (NSOM) with crossed beam spectral interferometry, to enable a full local optical characterization of photonic structures.

© 2013 Optical Society of America

PDF Article
More Like This
Characterization of silicon micro-optic structures with a near-infrared Near-field Scanning Optical Microscope

Webin Chen, Lirong Sun, Andrew Sarangan, and Qiwen Zhan
FTuT5 Frontiers in Optics (FiO) 2006

Spatiotemporal Control of Femtosecond Plasmon with Spectral Interferometry NSOM

Kazunori Toma, Shutaro Onishi, Miyuki Kusaba, Kenichi Hirosawa, and Fumihiko Kannari
TuPI_8 Conference on Lasers and Electro-Optics/Pacific Rim (CLEOPR) 2013

Measurement of hair cuticle structure using high-Q near-field scanning optical microscopy

Kyoung-Duck Park, Dae-Chan Kim, Won-Soo Ji, Beom-Hoan O, Se-Geun Park, El-Hang Lee, and Seung Gol Lee
JTuB28 Novel Techniques in Microscopy (NTM) 2009


You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
Login to access Optica Member Subscription