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Conferences > CLEOPR > 2020 > C12E > C12E_1

Direct Force Measurement with Reflective and Conductive Particles in Optical Tweezers

Isaac CD Lenton, Timo A Nieminen, Peter J Reece, Alexander B Stilgoe, and Halina Rubinsztein-Dunlop

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Abstract

Direct force measurement produces unexpected results for conductive and reflective particles when scattered light is partially collected. With numerical simulations, we explain this phenomenon and describe measurement configurations which correctly estimate forces on these particles.

© 2020 The Author(s)

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