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Robust TE0 + TE1 Waveguide Crossing

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Abstract

We proposed a silicon waveguide crossing device supporting both TE0 and TE1 modes, TE0 mode insertion loss about −1~ −1.2 dB and TE1 insertion loss about −0.5~ −1 dB, and the crosstalk is better than −30 dB.

© 2018 The Author(s)

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