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Optica Publishing Group
  • Conference on Lasers and Electro-Optics/Pacific Rim 2007
  • (Optica Publishing Group, 2007),
  • paper WP_137

Localized Surface Plasmon Microscope With an Illumination System Using a Zeroth-order Bessel Beam

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Abstract

We report a method to increase the measurement speed of the localized surface plasmon microscope. In our method, a zeroth-order Bessel beam is used to illuminate the Kretschmann configuration. The coupling efficiency of the illumination light is measured to find the refractive index on the metal.

© 2007 IEEE

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