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  • Conference on Lasers and Electro-Optics/Pacific Rim 2007
  • (Optica Publishing Group, 2007),
  • paper ME1_3

Degradation Induced Recombination-zone Shift in Mixed-host Organic Light-emitting Device

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Abstract

We investigate the degradation phenomena in a mixed-host organic light-emitting device by using an ultra thin red-emitting dopant as the probe for monitoring the recombination rate in the emitting layer. After the current stressing, the recombination peak shifts toward the hole-transport-layer side and the recombination zone becomes broader.

© 2007 IEEE

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