A hand-held, high-speed time-domain terahertz (TD-THz) reflection line-scanner for non-destructive examination (NDE) is described. The imager scans a line 150 mm wide and collects a TD-THz cross-sectional "B-scan" of the sub-surface structure at rates up to 15 Hz. By rolling the scanner over a surface, a 2D "C-Scan" image can be stitched together from the individual lines at a rate of 25-200 mm/s. The system >15 times faster than gantry imagers. The case is 8.7 in. wide, 12.5 in. long, and 7.9 in. high. The weight is approximately 7 lbs.
© 2010 Optical Society of AmericaPDF Article