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Conferences > CLEO > 2010 > CThEE > CThEE6

White Phasematching Noise: Random Duty-Cycle Errors in Quasi-Phase-Matching Devices

J. S. Pelc, C. R. Phillips, C. Langrock, D. Chang, and M. M. Fejer

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Abstract

Random duty-cycle errors in quasi-phase-matching gratings result in a phasematching pedestal, enhancing the efficiency of non-phasematched parasitic processes and thereby limiting device performance in many applications. We find good agreement between analytical modeling and experiments.

© 2010 Optical Society of America

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