Nonlinear index measurement by intracavity interferometry

A. Velten; A. Schmitt-Sody; J.-C. Diels

doi:10.1364/CLEO.2010.CFG4

Conference on Lasers and Electro-Optics 2010
OSA Technical Digest (CD) (Optica Publishing Group, 2010),
paper CFG4
•https://doi.org/10.1364/CLEO.2010.CFG4

Nonlinear index measurement by intracavity interferometry

A. Velten, A. Schmitt-Sody, and J.-C. Diels

Conference on Lasers and Electro-Optics 2010

San Jose, California United States
16–21 May 2010
ISBN: 978-1-55752-889-6

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Nonlinear Optical Materials (CFG)

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A. Velten, A. Schmitt-Sody, and J. -. Diels, "Nonlinear index measurement by intracavity interferometry," in Conference on Lasers and Electro-Optics 2010, OSA Technical Digest (CD) (Optica Publishing Group, 2010), paper CFG4.

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Abstract

Intracavity Phase Interferometry is applied to the measurement of nonlinear indices with a sensitivity and accuracy outperforming the z-scan. The sample is placed in a mode-locked laser cavity in which two pulses circulate independently.

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