Generalized Ohm’s Law is used to model the phenomenon of broadband asymmetric reflectance recently observed in semicontinuous metal-dielectric films in the proximity of the percolation threshold. Qualitative agreement with experiment is achieved.
© 2009 Optical Society of America
You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
Login to access OSA Member Subscription