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  • Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies
  • Technical Digest (CD) (Optica Publishing Group, 2006),
  • paper CFI4

Loss Characterization and Surface Passivation in Silicon Microphotonics

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Abstract

High-quality factor (Q~1−5×106) microresonators are used to probe the optical properties of silicon-on-insulator surfaces with 0.04% monolayer sensitivity. A rapid and accurate measurement of linear and nonlinear absorption is utilized to assess new surface- passivation techniques.

© 2006 Optical Society of America

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