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Conferences > CLEO > 2005 > JTuC > JTuC13
  • Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science and Photonic Applications Systems Technologies
  • Technical Digest (CD) (Optica Publishing Group, 2005),
  • paper JTuC13

Probing electrical signals in silicon CMOS devices using electric field induced second harmonic generation

Euan Ramsay, Dong Xiao, Derryck T. Reid, Bernd Offenbeck, Jan Sundermeyer, Kay Seemann, and Norbert Weber

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Abstract

We report the use of electric-field-induced second harmonic generation to investigate the electrical signal in a CMOS chip with 2.3µm femtosecond pulses. A linear relationship between the signal and electric field is found.

© 2005 Optical Society of America

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