Two-Photon Microscopy with High Depth of Field using an Axicon

P. Dufour; N. McCarthy; Y. De Koninck

Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science and Photonic Applications Systems Technologies
Technical Digest (CD) (Optica Publishing Group, 2005),
paper CWP4

Two-Photon Microscopy with High Depth of Field using an Axicon

P. Dufour, N. McCarthy, and Y. De Koninck

Conference on Lasers and Electro-Optics 2005

Baltimore, Maryland United States
22–27 May 2005
ISBN: 1-55752-770-9

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Nonlinear Optical Microscopy (CWP)

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P. Dufour, N. McCarthy, and Y. De Koninck, "Two-Photon Microscopy with High Depth of Field using an Axicon," in Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science and Photonic Applications Systems Technologies, Technical Digest (CD) (Optica Publishing Group, 2005), paper CWP4.

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Abstract

We have developed a two-photon microscopy system based on an axicon. This optical component can provide a focal line with a good transverse resolution and a high depth of field that speeds up data acquisition.

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