Novel interferometric ellipsometer with wavelength-swept source

Lionel R. Watkins

Conference on Lasers and Electro-Optics 2004

San Francisco, California United States
16–21 May 2004
ISBN: 1-55752-770-9

From the session
Optical Sensors and Instrumentation (CTuGG)

Novel interferometric ellipsometer with wavelength-swept source

Lionel R. Watkins

Conference on Lasers and Electro-Optics/International Quantum Electronics Conference and Photonic Applications Systems Technologies
Technical Digest (CD) (Optical Society of America, 2004),
paper CTuGG3

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L. R. Watkins, "Novel interferometric ellipsometer with wavelength-swept source," in Conference on Lasers and Electro-Optics/International Quantum Electronics Conference and Photonic Applications Systems Technologies, Technical Digest (CD) (Optical Society of America, 2004), paper CTuGG3.

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Related Topics
Optics & Photonics Topics
?

The topics in this list come from the OSA Optics and Photonics Topics applied to this article.
- Fringes
- Modulation
Previously assigned OCIS codes
- Instrumentation, measurement, and metrology (120.0120)
- Ellipsometry and polarimetry (120.2130)
- Interferometry (120.3180)

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Abstract

A novel interferometric ellipsometer with no moving parts which uses a semiconductor laser diode as the source is described. Temporal fringes are produced by modulation of the bias current and unbalanced arms of the interferometer.

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Abstract

Conference on Lasers and Electro-Optics 2004

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