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Conferences > CLEO > 2003 > CThT > CThT5
  • Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference
  • Technical Digest (Optica Publishing Group, 2003),
  • paper CThT5

Measurement of the index of refraction of a Flat zinc germanium phosphide wafer in the infrared

Glen D. Gillen and Shekhar Guha

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Abstract

We have developed and tested a novel application of interferometry to determine the absolute refractive index of individual infrared materials having flat and parallel surfaces without alteration of the sample in any way, and measured no for ZnGeP2.

© 2003 Optical Society of America

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