Abstract

For over a decade it has been known that terahertz time-domain spectroscopy systems can be used to determine the frequency dependent optical properties of materials in the submillimeter wavelength regime. More recently 2 dimensional (2D) THz imaging systems1,2 have been demonstrated for a diverse range of applications. However, using these imaging techniques the three-dimensional structure of the object has been unavailable until now. In particular the effects of variations in topography and the far-infrared optical properties of the sample have been indistinguishable.

© 2002 Optical Society of America

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