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  • Conference on Lasers and Electro-Optics
  • OSA Technical Digest (Optica Publishing Group, 2002),
  • paper CThT4

Single-shot Measurements of Carrier-envelope Phase Using Time-dependent Polarization Pulse

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Abstract

The control the CEP-slip of mode-locked laser oscillators are demonstrated recently.1,2 To use the amplified high-intensity pulses, however, measurement of the CEP on a single-shot basis is preferable. Some methods were proposed for single-shot CEP measurement,3,4 and we previously reported a demonstration of single-shot measurements of the changes of the CEP in the frequency domain.5 Here, we propose a method for the single-shot measurement of the CEP by observing the electron angular distribution generated by ionization by a time-dependent polarization (TDP) pulse. This method is related to the proposed method by Dietrich et al.3

© 2002 Optical Society of America

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