Abstract

A detailed understanding of the mechanisms responsible for the degradation and failure of Vertical Cavity Surface Emitting Lasers (VCSELs) is needed to fully enable the use of these devices in practical applications. Detailed reviews, ^1,2 have been written that discuss failure mechanisms in conventional edge emitting lasers designs. However, the more complex architecture of the VCSEL design suggests that other or additional degradation mechanism might be operable during the process of VCSEL failure. Therefore, using a combination of Focussed Ion Beam (FIB) and Transmission Electron Microscopy (TEM) techniques, we elucidate the defect structures responsible for degradation and failure in these devices.

© 2002 Optical Society of America