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  • Conference on Lasers and Electro-Optics
  • OSA Technical Digest (Optica Publishing Group, 2001),
  • paper CWL2

Self-interference fluorescent emission microscopy -5nm vertical resolution

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Abstract

We present a new method of fluorescence imaging, which yields an unprecedented vertical resolution. The basic principles arc related to an already well-established technique of using spatially modulated emission intensity from standing waves.1,2

© 2001 Optical Society of America

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