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Conferences > CLEO > 2000 > CThO > CThO4
  • Conference on Lasers and Electro-Optics
  • OSA Technical Digest (Optica Publishing Group, 2000),
  • paper CThO4

Analysis of trace element in solids by using laser ablation atomic fluorescence spectroscopy

M.-K. Kim, H. Ishii, T. Takao, Y. Oki, and M. Maeda

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Abstract

We have proposed a very sensitive detection technique of trace element in samples such as polymers, metals and semiconductors. It is called laser ablation atomic fluorescence (LAAF) spectroscopy,1 which combines laser ablation process to atomize the sample surface and laser-induced fluorescence (LIF) spectroscopy to make a quantitative analysis of the atoms in the ablated plume.

© 2000 Optical Society of America

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