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Conferences > CLEO > 1999 > CTuK > CTuK52
  • Conference on Lasers and Electro-Optics
  • OSA Technical Digest (Optica Publishing Group, 1999),
  • paper CTuK52

Novel technique for evaluation of optical confinement in semiconductor lasing structures through spatially and spectrally resolved emission spectra

S. Bidnyk, T.J. Schmidt, B.D. Little, J. Krasinski, and J.J. Song

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Abstract

At present, the main focus of III-V nitride research is the optimization of current-injected laser diodes1 in order to achieve a low lasing threshold and extend the lifetime of working devices.

© 1999 Optical Society of America

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