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Conferences > CLEO > 1999 > CThN > CThN2
  • Conference on Lasers and Electro-Optics
  • OSA Technical Digest (Optica Publishing Group, 1999),
  • paper CThN2

Temperature dependence of the reflectivity of silicon with surface oxide at wavelengths of 633 nm and 1047 nm

Jörg Heller, Johann W. Bartha, Chie C. Poon, and Andrew C. Tam

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Abstract

The reflectivity change of materials due to phase changes or relatively large changes in temperature have been studied extensively in the literature.1

© 1999 Optical Society of America

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