Modulation and noise measurements from 1520 to 1560 nm in monolithic widely tunable semiconductor lasers

P.J. Rigole; R. Schatz; E. Goobar; A.A. Saavedra; A.A. Saavedra

Conference on Lasers and Electro-Optics
(Optica Publishing Group, 1998),
paper CWN3

Modulation and noise measurements from 1520 to 1560 nm in monolithic widely tunable semiconductor lasers

P.J. Rigole, R. Schatz, E. Goobar, and A.A. Saavedra

Conference on Lasers and Electro-Optics 1998

San Francisco, California United States
3–8 May 1998
ISBN: 1-55752-540-4

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Materials and Processing for Telecom Lasers (CWN)

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P. J. Rigole, R. Schatz, E. Goobar, and A. A. Saavedra, "Modulation and noise measurements from 1520 to 1560 nm in monolithic widely tunable semiconductor lasers," in Conference on Lasers and Electro-Optics, D. Scifres and A. Weiner, eds., (Optica Publishing Group, 1998), paper CWN3.

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Abstract

Widely tunable semiconductor lasers have a large number of applications as in optical fiber communica tion systems, metrology, and spectroscopy.

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