Diffraction from oxide confinement apertures in VCSELs

P. A. Roos; J. L. Carlsten; D. C. Kilper; D. C. Kilper; K. L. Lear; K. L. Lear

Conference on Lasers and Electro-Optics
(Optica Publishing Group, 1998),
paper CThS4

Diffraction from oxide confinement apertures in VCSELs

P. A. Roos, J. L. Carlsten, D. C. Kilper, and K. L. Lear

Conference on Lasers and Electro-Optics 1998

San Francisco, California United States
3–8 May 1998
ISBN: 1-55752-540-4

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VCSEL Device Structures (CThS)

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P. A. Roos, J. L. Carlsten, D. C. Kilper, and K. L. Lear, "Diffraction from oxide confinement apertures in VCSELs," in Conference on Lasers and Electro-Optics, D. Scifres and A. Weiner, eds., (Optica Publishing Group, 1998), paper CThS4.

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Abstract

The integration of oxide confinement apertures into vertical-cavity surface-emitting laser (VCSEL) structures has dramatically influenced the electrical and optical characteristics of these devices.

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