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Optica Publishing Group
  • Conference on Lasers and Electro-Optics
  • (Optica Publishing Group, 1998),
  • paper CMD6

Optical near-field photocurrent spectroscopy: a tool for nondestructive analysis of optoelectronic devices

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Abstract

Optical near-field microscopy (NSOM) and related methods display a rapid development as powerful new analytical tools for the investigation of optoelectronic devices.

© 1998 Optical Society of America

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