Time-resolved detection of surface plasmon polaritons with a scanning tunneling microscope

Ulrich D. Keil; Taekjip Ha; Taekjip Ha; Jacob R. Jensen; Jørn M. Hvam

Conference on Lasers and Electro-Optics
(Optica Publishing Group, 1998),
paper CFJ1

Time-resolved detection of surface plasmon polaritons with a scanning tunneling microscope

Ulrich D. Keil, Taekjip Ha, Jacob R. Jensen, and Jørn M. Hvam

Conference on Lasers and Electro-Optics 1998

San Francisco, California United States
3–8 May 1998
ISBN: 1-55752-540-4

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Ultrafast Measurement Techniques (CFJ)

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U. D. Keil, T. Ha, J. R. Jensen, and J. M. Hvam, "Time-resolved detection of surface plasmon polaritons with a scanning tunneling microscope," in Conference on Lasers and Electro-Optics, D. Scifres and A. Weiner, eds., (Optica Publishing Group, 1998), paper CFJ1.

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Abstract

Laser-induced surface plasmon polaritons (SPPs) have been measured with a scanning tunneling microscope (STM) through heating of the tunneling junction and by rectification of the plasmon field.¹

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