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Conferences > CLEO > 1996 > CWP > CWP6
  • Conference on Lasers and Electro-Optics
  • OSA Technical Digest (Optica Publishing Group, 1996),
  • paper CWP6

Nanometer-scale surface analysis by laser-ablation fluorescence spectroscopy

Yuji Oki, Mitsuo Maeda, and Akira Hirano

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Abstract

Laser ablation is a very useful technique for surface analysis, as well as material processing. Previously we proposed to apply this technique to the trace element detection in pure water,1 where laser ablation is used to atomize the sample and atoms are detected by laser-induced fluorescence (LIF). We call it LAAF (laser ablation atomic fluorescence) spectroscopy.

© 1996 Optical Society of America

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