Local surface deformation analysis by photothermal method

M. Bertolotti; R. Li Voti; S. Paoloni; C. Sibilia; G. L. Liakhou; G. L. Liakhou

Conference on Lasers and Electro-Optics
OSA Technical Digest (Optica Publishing Group, 1996),
paper CWP5

Local surface deformation analysis by photothermal method

M. Bertolotti, R. Li Voti, S. Paoloni, C. Sibilia, and G. L. Liakhou

Conference on Lasers and Electro-Optics 1996

Anaheim, California United States
2–7 June 1996
ISBN: 1-55752-443-2

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Surface Layer Imaging and Analysis (CWP)

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M. Bertolotti, R. Li Voti, S. Paoloni, C. Sibilia, and G. L. Liakhou, "Local surface deformation analysis by photothermal method," in Conference on Lasers and Electro-Optics, J. Bowers, D. Miller, D. Scifres, and A. Weiner, eds., Vol. 9 of OSA Technical Digest (Optica Publishing Group, 1996), paper CWP5.

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Abstract

During the past few years a great deal of attention has been focused on the development of photothermal methods in order to characterize the thermal properties of solid samples.¹

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