Abstract
The Cleaved Coupled Cavity (C3) lasers of the 1980's although when working well realised high side-mode suppression ratios, did not meet the criteria for repeatability and performance from device to device and thus went out of favor. Here we show that focused ion beam etching (FIBE), offers a fresh approach to tackling the problem of dividing and modifying lasers.
© 1996 Optical Society of America
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