Abstract

Two kinds of crystal spectrometer, a focusing bent crystal spectrometer (BCS) and a pinhole crystal spectrometer (PCS), are described for x-ray laser experimental study at the high, power laser facility of SIOFM. As an improvement to a flat crystal spectrometer, our BCS can be used either as a high spectral resolution device or as a high quality monochromatic x-ray imaging of an extended laser-produced plasma. Its focusing and imaging properties are shown in Fig. 1. Numerical calculations of the BCS’s configuration are presented, aiming at broader spectrum, range and higher spectral resolution. In our PCS, an appropriate pinhole is put in front of a flat crystal spectrometer. By using the PCS, the one-dimensional space resolution ability of the spectrometer is reserved and the source-broadening effect in a uniform line- shaped plasma can be eliminated. The space-resolved spectrum of a line-shaped Mg plasma and its distribution of densitogram as a function of the distance from the target surface are presented. The spectroscopic diagnostics of a PCS in line-shaped plasma measurement and its possible uses in an experimental x-ray laser investigation are also described.

© 1993 Optical Society of America