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Optica Publishing Group
  • Conference on Lasers and Electro-Optics
  • OSA Technical Digest (Optica Publishing Group, 1993),
  • paper CFI1

EZ-scan—a method to achieve a sensitivity to induced phase distortions of λ/3000

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Abstract

The Z-scan1 has been widely used to measure optical nonlinearities including the nonlinear refractive index, π2. For the Z-acan technique, the laser is focused and an aperture is placed in front of a detector positioned in the far field. The transmittance is then measured as a function of the position of the sample with respect to the beam waist (i.e., with respect to Z).

© 1993 Optical Society of America

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