Abstract

The theory of formation of refractive index gratings by the photorefractive effect is well established, and standard models have been solved both analytically and numerically for certain useful cases.1-3 Until now, however, there have been no direct measurements of the photorefractive space charge field profile with which to compare the models' predictions for the amplitudes of the higher frequency components of the grating. We have recently used high resolution x-ray diffraction imaging (also known as topography) to observe the electric field induced crystal deformations associated with photorefractive gratings.

© 1993 Optical Society of America

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