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Optica Publishing Group
  • Conference on Lasers and Electro-Optics
  • OSA Technical Digest (Optica Publishing Group, 1991),
  • paper CTuR3

Accurate phase referencing for electro-optic frequency response measurements of GaAs MMIC devices

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Abstract

Several different groups have used electro-optic sampling to measure the frequency response of internal nodes in integrated circuits.1,2 These measurements, however, have only reported the amplitude response as a function of frequency due, in part, to difficulty in maintaining a constant phase reference.

© 1991 Optical Society of America

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