Current developments and principles of laser-based resonance ionization mass spectrometry

P. BENETTI; A. TOMASELLI

Conference on Lasers and Electro-Optics
OSA Technical Digest (Optica Publishing Group, 1989),
paper WK5

Current developments and principles of laser-based resonance ionization mass spectrometry

P. BENETTI and A. TOMASELLI

Conference on Lasers and Electro-Optics 1989

Baltimore, Maryland United States
24–28 April 1989
ISBN: 1-55752-086-0

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Surface Characterization and Imaging (WK)

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P. BENETTI and A. TOMASELLI, "Current developments and principles of laser-based resonance ionization mass spectrometry," in Conference on Lasers and Electro-Optics, R. Bartolini, P. Liao, J. Bufton, and W. Krupke, eds., Vol. 11 of OSA Technical Digest (Optica Publishing Group, 1989), paper WK5.

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Abstract

Resonance ionization mass spectrometry (RIMS) is a promising technique mainly devoted, although not limited, to ultratrace chemical analysis.¹

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