Abstract
Confocal scanning optical microscopes (CSOMs) have two advantages over conventional microscopes: (1) improved transverse resolution, imaging twice the spatial frequencies of conventional microscopes; (2) a shallow depth of focus making them ideal for optical sectioning because there is no glare from out-of-focus portions of the sample.1 Optical microscopy can become a still more sensitive tool for diagnostics if some method of imaging phase information is available. In conventional microscopes this is most widely accomplished with Zernike phase contrast systems or Nomarski DIG techniques. In CSOMs heterodyne interference techniques have been used.2 We have developed an electrooptic cell, which when placed in a conventional CSOM converts it to a Zernike-type phase sensitive CSOM.
© 1988 Optical Society of America
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