Abstract
Waveguide devices using Ti-diffused z-cut LiNbO3 have the advantage of low insertion loss. Many studies have been done. However, there are few reports about temperature dependence,1 which is one of the most important problems in practical devices. We studied the mechanism of the temperature dependence of z-cut Ti:UNbO3 devices and propose a thermally stabilized device structure.
© 1986 Optical Society of America
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