Abstract

We shall review recent progress toward the development of a complete electronics instrumentation system for precision measurements of electronic devices and materials with picosecond resolution. This approach is based on use of new high speed photoconductivity materials in novel circuit configurations, which, when illuminated by picosecond optical pulses, can be used to generate and sample picosecond electrical impulses. The specifications of a typical system operating at 82 MHz are.

© 1982 Optical Society of America