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Generation of an infrared pattern for sensor testing using a scanning laser beam

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Abstract

Energy deposited on an absorbing conducting amorphous material results in a local temperature increase which depends on the laser dwell time and power density. This combination acts as a source of IR radiation which can be used to test high-performance sensors by varying the contrast and the average amount of emitted radiation. By varying the scanning parameters to control the localized temperature increase, a testing pattern can be generated with the equivalent blackbody temperature of up to 900 K and temperature differences of the order of 0.2 K.

© 1982 Optical Society of America

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