Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Effects at ambipolar assess carrier diffusion in pulsed laser annealing of semiconductors

Not Accessible

Your library or personal account may give you access

Abstract

Local beating by laser beam radiation has been shown to be a fast and efficient means of processing semiconductors. There are two competing models proposed for annealing mechanism, namely, the thermal melting model vs the nonthermal approach. An important physical process that has to be clarified is the effect of ambipolar diffusion of excess charge carriers during high power laser beam irradiation.

© 1981 Optical Society of America

PDF Article
More Like This
Melting phenomenon and laser annealing in semiconductors

J. Narayan, J. Fletcher, C. W. White, R. E. Eby, and W. H. Christie
THC3 Conference on Lasers and Electro-Optics (CLEO:S&I) 1981

Fundamentals of laser annealing and quenching

N. Bloembergen
THA1 Conference on Lasers and Electro-Optics (CLEO:S&I) 1981

Laser annealing and crystallization of silicon

G. K. Celler
THC1 Conference on Lasers and Electro-Optics (CLEO:S&I) 1981

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.