High resolution microscopes are detrimentally affected by specimen-induced aberrations, which can be corrected using adaptive optics. Methods and applications are presented for a range of microscopes and for STED and single molecule localization nanoscopy.
© 2015 Optical Society of America
You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
Login to access OSA Member Subscription