LED-based phase imaging interference microscopy is a technique that combines phase shifting interferometry with multi-wavelength optical phase unwrapping. It is used to obtain phase maps of an object without 2π discontinuities and with reduced noise.

© 2006 Optical Society of America

PDF Article


You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
Login to access OSA Member Subscription