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Conferences > BGPP > 2003 > WB > WB5

Comparison of Characterization Techniques and the Effect of Surface Condition in Poled Silica

G. A. Quintero, C. S. Franco, H. R. Carvalho, D. M. González, P. M. P. Gouvêa, I. C. S. Carvalho, A. L. C. Triques, B. Lesche, N. Myren, W. Margulis, G. Martinelli, Y. Quiquempois, A. Kudlinski, and H. Zeghlache

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Abstract

The width of the depletion region in silica samples thermally poled during various time intervals is compared with four characterization techniques, in an attempt to unify their findings. The effect of the initial surface condition on the formation of the depletion region is also investigated by briefly etching the samples prior to poling. Reproducible results are found for depths ≥2 µm.

© 2003 Optical Society of America

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