Abstract

We report a method based on Malus law to directly measure the dielectric frame orientation of monoclinic crystals with an accuracy of 0.3°. It was validated by the study of Nd3+:YCa4O(BO3)3, Sn2P2S6, BiB3O6 and Eu3+:Y2SiO5.

© 2014 Optical Society of America

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