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Conferences > ACPC > 2015 > AM3F > AM3F.6

Dependence of Noise Tolerance on Depth of Learning in BPSK Label Processing Using Complex-Valued Neural-Network

Hanayo Fujimoto, Hiroki Kishikawa, Nobuo Goto, and Shin-ichiro Yanagiya

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Abstract

Optical neural-network to process PSK labels for photonic routing is proposed, which consists of optical amplifiers, phase shifters and nonlinear thresholders. Noise tolerance for incident labels is improved by reducing learning depth for weights.

© 2015 Optical Society of America

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