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Conferences > Photonics > 2016 > P1A > P1A.14

Thickness dependent optical properties of MoS2 thin films probed by spectroscopic ellipsometry

Gobinda Pradhan, Rahul Kesarwani, Alika Khare, and Ashwini Kumar Sharma

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Abstract

Bilayer and multilayer MoS2 films have been prepared by pulsed laser deposition technique. Spectroscopic ellipsometry spectra have been fitted with Tauc- Lorentz dispersion model. The fitting reveals thickness dependent band gap of MoS2 thin films.

© 2016 Optical Society of America

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