Optical characterization of thin metal films

Alexander V. Tikhonravov; Michael K. Trubetskov; Oleg F. Prosovskiy; Michael A. Kokarev

doi:10.1364/OIC.2007.WDPDP2

Optical Interference Coatings
OSA Technical Digest (CD) (Optica Publishing Group, 2007),
paper WDPDP2
•https://doi.org/10.1364/OIC.2007.WDPDP2

Optical characterization of thin metal films

Alexander V. Tikhonravov, Michael K. Trubetskov, Oleg F. Prosovskiy, and Michael A. Kokarev

Optical Interference Coatings 2007

Tucson, Arizona United States
3–8 June 2007
ISBN: 1-55752-841-1

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A. V. Tikhonravov, M. K. Trubetskov, O. F. Prosovskiy, and M. A. Kokarev, "Optical characterization of thin metal films," in Optical Interference Coatings, OSA Technical Digest (CD) (Optica Publishing Group, 2007), paper WDPDP2.

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Abstract

The origin of difficulties connected with optical characterization of thin metal films is theoretically explained. A methodology of optical characterization that can raise an accuracy of determination of optical parameters of thin metal films is proposed.

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