Single Arm Interferometer System for Reflective Micro-device Phase Measurement

Dale E. Ewbank

doi:10.1364/OFT.2010.OWC2

International Optical Design Conference and Optical Fabrication and Testing
OSA Technical Digest (CD) (Optica Publishing Group, 2010),
paper OWC2
•https://doi.org/10.1364/OFT.2010.OWC2

Single Arm Interferometer System for Reflective Micro-device Phase Measurement

Dale E. Ewbank

Optical Fabrication and Testing 2010

Jackson Hole, Wyoming United States
13–17 June 2010
ISBN: 978-1-55752-893-3

From the session
Micro-Integrated Optics (OWC)

Not Accessible

Your library or personal account may give you access

Get PDF
Email
Share
Get Citation
Copy Citation Text
D. E. Ewbank, "Single Arm Interferometer System for Reflective Micro-device Phase Measurement," in International Optical Design Conference and Optical Fabrication and Testing , OSA Technical Digest (CD) (Optica Publishing Group, 2010), paper OWC2.

Export Citation
- BibTex
- Endnote (RIS)
- HTML
- Plain Text
Citation alert
Save article

Abstract

A Pohl fringe-producing system is used to measure phase for reflective electro-optical micro-devices at visible wavelengths. Relative phase versus voltage is extracted for devices utilizing polymer dispersed liquid crystal materials as the active layer.

PDF Article

More Like This

Optical test system for reflective electro-optical adaptive micro-device phase measurement

Dale E. Ewbank
OFMC6 Optical Fabrication and Testing (OF&T) 2006

Reflected-Phase Measurement of Azimuth-Rotated Guided-Mode Resonance Device Using Pohl Interferometer

Cheng-Tsung Chang, Jaturon Tongpakpanang, and Wen-Kai Kuo
P_CTu17_13 Conference on Lasers and Electro-Optics/Pacific Rim (CLEO/PR) 2022

Quantitative birefringence measurements using a single-arm polarization-sensitive OCT system

Tahereh Marvdashti, Lian Duan, Kristen L. Lurie, and Audrey K. Ellerbee
BT3A.65 Biomedical Optics (BIOMED) 2014

Previous Article Next Article